Your selections:
Making a commercial atomic force microscope more accurate and faster using positive position feedback control
- Mahmood, I. A., Moheimani, S. O. Reza
Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis
- Maess, Johannes, Fleming, Andrew J., Allgoewer, Frank
A simple counter-flow cooling system for a supersonic free-jet beam source assembly
- Barr, M., Fahy, A., Martens, J., Dastoor, P. C.
Resonant control of an atomic force microscope micro-cantilever for active Q control
- Fairbairn, M., Moheimani, S. O. R.
Recovering the spectrum of a low level signal from two noisy measurements using the cross power spectral density
- Fleming, Andrew J., Ninness, Brett, Wills, Adrian
A serial-kinematic nanopositioner for high-speed atomic force microscopy
- Wadikhaye, Sachin P., Yong, Yuen Kuan, Reza Moheimani, S. O.
High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues
- Bazaei , A., Yong , Yuen K., Moheimani , S. O. Reza
Note: A method for estimating the resolution of nanopositioning systems
Simultaneous sensing and actuation with a piezoelectric tube scanner
- Moheimani, S. O. Reza, Yong, Yuen K.
Note: An improved low-frequency correction technique for piezoelectric force sensors in high-speed nanopositioning systems
- Yong, Yuen K., Fleming, Andrew J.
Signal transformation approach to fast nanopositioning
- Sebastian, Abu, Moheimani, S. O. Reza
Diagonal control design for atomic force microscope piezoelectric tube nanopositioners
- Bhikkaji, B., Yong, Y. K., Mahmood, I. A., Moheimani, S. O. R.
Existing methods for improving the accuracy of digital-to-analog converters
- Eielsen, Arnfinn A., Fleming, Andrew J.
A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy
- Karvinen, K. S., Moheimani, S. O. R.
Atomic force microscopy with a 12-electrode piezoelectric tube scanner
- Yong, Yuen K., Ahmed, Bilal, Moheimani, S. O. Reza
A novel self-sensing technique for tapping-mode atomic force microscopy
- Ruppert, Michael G., Moheimani, S. O. Reza
Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges
- Tremsin, A. S., Sokolova, A. V., Salvemini, F., Luzin, V., Paradowska, A., Muransky, O., Kirkwood, H. J., Abbey, B., Wensrich, C. M., Kisi, E. H.
Neutron diffraction strain tomography: demonstration and proof-of-concept
- Gregg, A. W. T., Hendriks, J. N., Wensrich, C. M., Luzin, V., Wills, A.
Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing
- Ruppert, Michael G., Yong, Yuen K.
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